?-Irradiated [(CH3)4N]2SiF6 Single Crystal Investigation by Electron Paramagnetic Resonance Technique

Abstract

In this study, γ-irradiation damage centers in [(CH<inf>3</inf>)<inf>4</inf>N]<inf>2</inf>SiF<inf>6</inf> single crystal has been investigated by electron paramagnetic resonance spectroscopy (EPR) at room temperature. It has been found that γ-irradiation produces the (CH<inf>3</inf>)<inf>3</inf> over(N, •)+ radicals in this compound. The g factor and the hyperfine constant for H atoms, measured as 28.7 G, were found to be isotropic. The hyperfine coupling constant of the N nucleus, observed (CH<inf>3</inf>)<inf>3</inf> over(N, •)+ hole radical in [(CH<inf>3</inf>)<inf>4</inf>N]<inf>2</inf>SiF<inf>6</inf> was found to be anisotropic with A<inf>//</inf> = 15 and A<inf>⊥</inf> = 23 G, respectively. This means that each methyl groups rotate around the C<inf>3 ν</inf>-axis and they also rotate around the C<inf>3 ν</inf>-axis of (CH<inf>3</inf>)<inf>3</inf> over(N, •)+ radical. These results were compared with the earlier studies in (CH<inf>3</inf>)<inf>3</inf> over(N, •)+ radical and discussed. © 2006 Elsevier B.V. All rights reserved.