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Publication:
Calculation of the Range of Medium-Energy F, Cs, and Ga Ions in Silicon Carbide

dc.authorscopusid6603209491
dc.contributor.authorKabadayi, Ö.
dc.date.accessioned2025-12-11T02:17:05Z
dc.date.issued2004
dc.departmentOndokuz Mayıs Üniversitesien_US
dc.department-temp[Kabadayi] Önder, Department of Physics, Ondokuz Mayis Üniversitesi, Samsun, Turkeyen_US
dc.description.abstractWe present simulation results for the implantation of fast F, Cs, and Ga ions into amorphous SiC using a technique that we developed in a previous work.Bragg's rule is employed to calculate the electronic and nuclear stopping powers in the compound. To find ion ranges, numerical solution of the first-order ODE have been performed by using Fehlberg fourth- and fifth-order Runge-Kutta method. The results are compared with experimental data, as well as with the result of the Monte Carlo program SRIM and other standard procedures such as PRAL.It is found that the agreement between our method and the literature is good.en_US
dc.identifier.doi10.1139/p04-015
dc.identifier.endpage386en_US
dc.identifier.issn0008-4204
dc.identifier.issue5en_US
dc.identifier.scopus2-s2.0-3142565089
dc.identifier.scopusqualityQ3
dc.identifier.startpage379en_US
dc.identifier.urihttps://doi.org/10.1139/p04-015
dc.identifier.urihttps://hdl.handle.net/20.500.12712/47823
dc.identifier.volume82en_US
dc.identifier.wosqualityQ3
dc.institutionauthorKabadayi, Ö.
dc.language.isoenen_US
dc.relation.ispartofCanadian Journal of Physicsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.titleCalculation of the Range of Medium-Energy F, Cs, and Ga Ions in Silicon Carbideen_US
dc.typeArticleen_US
dspace.entity.typePublication

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